Measurement of the modulation transfer function of a slow-scan CCD camera on a TEM using a thin amorphous film as test signal

Ultramicroscopy

Volumn 64, Issue 1-4, 1996, Pages 49-55

  Van Zwet, E J ^a   Zandbergen, H W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; IMAGE PROCESSING; TRANSFER FUNCTIONS;

SLOW-SCAN CCD CAMERA;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; HOLOGRAPHY;

EID: 0030221780     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00014-9     Document Type: Article

References (6)

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3. [3] I. Daberkow, K.-H. Herrmann, L. Liu and W.D. Rau, Ultramicroscopy 38 (1991) 215.
4. [4] W.J. de Ruijter and J.K. Weiss, Rev. Sci. Instrum. 63 (1992) 4314.
5. [5] K. Ishizuka, Ultramicroscopy 52 (1993) 7.
6. [6] A.V. Oppenheim, A.S. Willsky and I.T. Young, Signals and Systems (Prentice-Hall, London, 1983).