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Volumn 58, Issue 1, 1997, Pages 37-42

Integrated thermal-conductivity vacuum sensor

Author keywords

Integrated sensors; Thermal conductivity vacuum sensors

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CONTROL; SEMICONDUCTING SILICON; TEMPERATURE CONTROL; THERMAL CONDUCTIVITY; VACUUM GAGES;

EID: 0030677236     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(97)80222-1     Document Type: Article
Times cited : (36)

References (10)
  • 8
    • 85033101846 scopus 로고    scopus 로고
    • 4676 Admiralty Way, Marina del Rey, CA 90292-6695, USA
    • Mosis 2.0 μm Analog CMOS process, 4676 Admiralty Way, Marina del Rey, CA 90292-6695, USA.
    • Mosis 2.0 μm Analog CMOS Process
  • 9
    • 0028531416 scopus 로고
    • Thermally and electrically isolated single crystal silicon structures in CMOS technology
    • R.J. Reay, E.H. Klaassen and G.T.A. Kovacs, Thermally and electrically isolated single crystal silicon structures in CMOS technology, IEEE Electron Device Lett., 15 (1994) 399-401.
    • (1994) IEEE Electron Device Lett. , vol.15 , pp. 399-401
    • Reay, R.J.1    Klaassen, E.H.2    Kovacs, G.T.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.