Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysis

Synthetic Metals

Volumn 83, Issue 3, 1996, Pages 261-265

  Bijnens, Wim ^a   Manca, Jean ^b   Wu, Ting Di ^b   D'Olieslaeger, Marc ^b   Vanderzande, Dirk ^a   Gelan, Jan ^a   De Ceuninck, Ward ^b   De Schepper, Luc ^b   Stals, Lambert M ^b  

^a Universitaire Campus Gebouw D   (Belgium)

^b HASSELT UNIVERSITY   (Belgium)

Author keywords

Ageing; Diodes; Electroluminescence; Microscopy; Spectroscopy

Indexed keywords

AGING OF MATERIALS; CATHODES; DIODES; ELECTRIC RESISTANCE; ELECTROLUMINESCENCE; FAILURE (MECHANICAL); OPTICAL MICROSCOPY; ORGANIC POLYMERS; OXIDATION; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; STRESSES;

DEPTH PROFILE ANALYSIS; IMPEDANCE SPECTROSCOPY; INDIUM TIN OXIDES; POLYPHENYLENE VINYLENES;

LIGHT EMITTING DIODES;

EID: 0030361030     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(97)80083-5     Document Type: Article

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