Cutting off the diffraction: A numerical solution in scanning near-field optical microscopy

Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3125-3127

  Xiao, Mufei ^a,b  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b Institute of Physics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; IMAGE ENHANCEMENT; IMAGE QUALITY; LIGHT PROPAGATION; MATHEMATICAL MODELS; SIGNAL PROCESSING; SURFACES;

CONSTANT HEIGHT SCAN MODE; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0030284742     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116803     Document Type: Article

References (10)

1. E. Betzig and J. K. Trautman, Science 257, 189 (1992).
2. Near Field Optics, edited by D. W. Pohl and D. Courjon (Kluwer, Dordrecht, 1993).
3. For recent developments, see Ultramicroscopy 57, (1995).
4. O. Keller, M. Xiao, and S. Bozhevolnyi, Surf. Sci. 280, 217 (1993); M. Xiao, S. Bozhevolnyi, and O. Keller, Appl. Phys. A 62, 115 (1996).
5. O. Keller, M. Xiao, and S. Bozhevolnyi, Surf. Sci. 280, 217 (1993); M. Xiao, S. Bozhevolnyi, and O. Keller, Appl. Phys. A 62, 115 (1996).
6. M. Xiao and S. Bozhevolnyi, Opt. Commun. 130, 337 (1996).
7. Similar simulations may be found in C. Girard, A. Dereux, Phys. Rev. B 49 11344 (1994), and the references therein.
8. P. B. Johnson and R. W. Christy, Phys. Rev. B 6, 4370 (1972).
9. M. Xiao, Chem. Phys. Lett. 258, 363 (1996).
10. M. Xiao, Opt. Commun. (to be published).