Evaluation of Failure Models Through Step-Stress Tests

IEEE Transactions on Reliability

Volumn 35, Issue 4, 1986, Pages 409-413

  luculano, Gaetano ^a   Zanini, Antonio ^a  

^a UNIVERSITY OF FLORENCE   (Italy)

Author keywords

Degradation rate; Failure Model; Step stress test

Indexed keywords

FAILURE ANALYSIS; RESISTORS - TESTING; STRESSES - THERMAL;

ARRHENIUS MODEL; LIFE ESTIMATION; METALLIC LAYER RESISTORS; QUALITY-STRESS RELATION; STEP-STRESS TESTS;

RELIABILITY THEORY;

EID: 0022789898     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1986.4335488     Document Type: Article

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