Reliability of Modified Designs: A Bayes Analysis of an Accelerated Test of Electronic Assemblies

IEEE Transactions on Reliability

Volumn 39, Issue 2, 1990, Pages 140-144

  Hart, Louis ^a  

^a IBM   (United States)

Author keywords

Accelerated test; Bayes; Electronic assembly

Indexed keywords

DECISION THEORY AND ANALYSIS; ELECTRONIC EQUIPMENT TESTING--ACCELERATION; PROBABILITY--RANDOM PROCESSES; RELIABILITY--ESTIMATION;

ACCELERATED LIFE TESTING; BAYESIAN ANALYSIS; ELECTRONIC ASSEMBLY TESTING;

ELECTRONIC EQUIPMENT;

EID: 0025448214     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/24.55871     Document Type: Article

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