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Volumn 103, Issue 4, 1995, Pages 454-465

Scanning force microscopy study of surface tracks induced in mica by 78.2-MeV 127I ions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000960308     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00789-X     Document Type: Article
Times cited : (41)

References (55)
  • 13
    • 0028274359 scopus 로고
    • Scanning tunneling microscopy: a surface science tool and beyond
    • (1994) Surface Science , vol.299-300 , pp. 956
    • Rohrer1
  • 25
    • 84919184709 scopus 로고    scopus 로고
    • D.D.N. Barlo Daya, A. Hallén, J. Eriksson, J. Kopniczky, R. Papaléo, C.T. Reimann, P. Håkansson, B.U.R. Sundqvist, A. Brunelle, S. Della-Negra and Y. Le Beyec, Nucl. Instr. and Meth. in Phys. Res. B (accepted, IBMM Conf. proc.).
  • 35
    • 84919184708 scopus 로고    scopus 로고
    • N.A. Burnham and R.J. Colton, in D. Bonnel (Ed.), Scanning Tunneling Microscopy: Theory and Applications (New York, VCH Publishers) in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.