Image fusion and subpixel parameter estimation for automated optical inspection of electronic components

IEEE Transactions on Industrial Electronics

Volumn 43, Issue 3, 1996, Pages 346-354

  Reed, James M ^a   Hutchinson, Seth ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; EDGE DETECTION; IMAGE COMPRESSION; NETWORK COMPONENTS; OPTICAL TESTING; PARAMETER ESTIMATION;

AUTOMATED OPTICAL INSPECTION; CIRCULAR FEATURES; ELECTRIC COMPONENTS; HIGH RESOLUTION IMAGE; IMAGE FUSION;

PRINTED CIRCUIT DESIGN;

EID: 0030170173     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/41.499806     Document Type: Article

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