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Volumn 3, Issue 2, 1990, Pages 87-106

On improving the accuracy of the Hough transform

Author keywords

high precision measurement; Hough transform; object location; straight line detection; subpixel accuracy

Indexed keywords

COMPUTER VISION; MATHEMATICAL TRANSFORMATIONS; PRECISION ENGINEERING;

EID: 0025399591     PISSN: 09328092     EISSN: 14321769     Source Type: Journal    
DOI: 10.1007/BF01212193     Document Type: Article
Times cited : (51)

References (47)
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  • 16
    • 84934223769 scopus 로고    scopus 로고
    • Galkowski JT, Galkowski PJ (1986) On the importance of signal-to-noise measures in machine vision: A case study of the Hough transform. IBM Federal Systems Division Technical Report 86-L57-003, Owego, NY
  • 18
    • 84934223768 scopus 로고    scopus 로고
    • Gordon SJ, Seering WP (1986) Accuracy issues in measuring quantized images of straight-line features. IEEE International Conference on Robotics and Automation, San Francisco, CA, pp 931–936
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    • GRAFSTAT User's Guide (1986), available from IBM
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    • Hough PVC (1962) Method and means for recognizing complex patterns. U.S. Patent 3069654
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    • Li CC, Mancuso JF, Shu DB, Sun YN, Roth LD (1983) A preliminary study of automated inspection of VLSI resist patterns. Proceedings of the IEEE International Conference on Robotics and Automation, pp 474–480
  • 35
    • 84934223760 scopus 로고    scopus 로고
    • Niblack W, Petkovic D (1986) On improving the accuracy of the Hough transform, theory, simulation, and experiments. Proceedings of Computer Vision and Pattern Recognition, Ann Arbor, Michigan, June, pp 574–579
  • 38
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    • Shapiro SD (1978) Generalization of the Hough transform for curve detection in noisy digital images. Fourth International Joint Conference on Pattern Recognition, Kyoto, Japan
  • 41
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    • Sheinvald J, Dom B, Niblack W (1989) Multiple curve detection using the MDL principle and the Hough transform. IBM Almaden Research Center


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.