Subpixel Measurements Using a Moment-Based Edge Operator

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 11, Issue 12, 1989, Pages 1293-1309

  Lyvers, Edward P ^a   Mitchell, Owen Robert ^b   Akey, Mark L ^c   Reeves, Anthony P ^d  

^a MIT LINCOLN LABORATORY   (United States)

^b UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^c Magnavox Electronics System Company ^*  (United States)

^d Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING--IMAGE ANALYSIS; MATHEMATICAL TECHNIQUES--OPERATORS; PROBABILITY--RANDOM PROCESSES; VISION--ARTIFICIAL;

COMPUTER VISION; IMAGE EDGE ANALYSIS; LAPLACIAN OF GAUSSIAN; PRECISION MEASUREMENTS; SUBPIXEL MEASUREMENTS;

MECHANICAL VARIABLES MEASUREMENT;

EID: 0024899113     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.41367     Document Type: Article

References (8)

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