A systematic approach to the measurement of ideality factor, series resistance, and barrier height for Schottky diodes

Journal of Applied Physics

Volumn 72, Issue 10, 1992, Pages 4739-4742

  Lee, T C ^a   Fung, S ^a   Beling, C D ^a   Au, H L ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001282904     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.352082     Document Type: Article

References (8)