Characterization of High Frequency Interconnects Using Finite Difference Time Domain and Finite Element Methods

IEEE Transactions on Microwave Theory and Techniques

Volumn 42, Issue 9, 1994, Pages 1727-1736

  Yook, Jong Gwan ^a   Dib, Nihad I ^a   Katehi, Linda P B ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CROSSTALK; ELECTRIC NETWORK ANALYSIS; FINITE DIFFERENCE METHOD; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MICROWAVE DEVICES; MONOLITHIC INTEGRATED CIRCUITS; PRINTED CIRCUIT DESIGN; RADIATION EFFECTS; SUBSTRATES; TIME DOMAIN ANALYSIS;

FINITE DIFFERENCE TIME DOMAIN METHODS; HIGH FREQUENCY INTERCONNECTS; MICROWAVE INTEGRATED CIRCUITS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

ELECTRIC WIRING;

EID: 0028495838     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.310581     Document Type: Article

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