Finite element analysis of MMIC structures using absorbing boundary conditions

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 1993, Pages 745-748

  Wang, J S ^a   Mittra, Raj ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; MICROSTRIP DEVICES; MICROWAVES; SCATTERING; SEMICONDUCTOR DEVICE STRUCTURES; STRIP TELECOMMUNICATION LINES; THREE DIMENSIONAL; WAVEGUIDES;

ABSORBING BOUNDARY CONDITION; FULL WAVE ANALYSIS; MESH TRUNCATION; MICROSTRIP LINE; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; WAVEGUIDE DISCONTINUITIES;

MONOLITHIC INTEGRATED CIRCUITS;

EID: 0027308435     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)