Characterization of proton interactions in electronic components

IEEE Transactions on Nuclear Science

Volumn 41, Issue 3, 1994, Pages 593-600

  Doucin, B ^a   Patin, Y ^a   Lochard, J P ^b   Beaucour, J ^b   Carriere, T ^c   Isabelle, D ^c   Buisson, J ^d   Corbiere, T ^c   Bion, T ^c  

^a DIF   (France)

^b AIRBUS DEFENCE AND SPACE   (Germany)

^c CNRS/CERI 3 A rue de la Ferollerie ^*  (France)

^d CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CODES (SYMBOLS); COMPUTER SIMULATION; ENERGY DISSIPATION; FORECASTING; MONTE CARLO METHODS; NUCLEAR PHYSICS; PARTICLE BEAM DYNAMICS; PROTONS; RADIATION EFFECTS; SEMICONDUCTING SILICON;

ENERGY DEPOSITION; LINEAR ENERGY TRANSFER; NUCLEAR REACTION; PROTON INTERACTIONS; SINGLE EVENT UPSET;

ELECTRONIC EQUIPMENT;

EID: 0028447526     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.299805     Document Type: Article

References (12)

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