메뉴 건너뛰기




Volumn 68, Issue 25, 1996, Pages 3620-3622

A design of reflection scanning near-field optical microscope and its application to AlGaAs/GaAs heterostructures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0013600080     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115749     Document Type: Review
Times cited : (9)

References (10)
  • 2
    • 21544436741 scopus 로고
    • E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostelak, Science 251, 1468 (1991); E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2482 (1992).
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 2482
    • Betzig, E.1    Finn, P.L.2    Weiner, J.S.3
  • 4
    • 0013609481 scopus 로고    scopus 로고
    • Reflection scanning near-field optical microscopy has been discussed in the literature. For example, see J. A. Cline and M. Isaacson, Appl. Optics 34, 4869 (1995). However, those reflection SNOM designs still utilize shear-force feedback.
    • Reflection scanning near-field optical microscopy has been discussed in the literature. For example, see J. A. Cline and M. Isaacson, Appl. Optics 34, 4869 (1995). However, those reflection SNOM designs still utilize shear-force feedback.
  • 5
    • 21544470091 scopus 로고    scopus 로고
    • Günter Guttroff, M. S. thesis, University of Texas at Austin, 1995.
    • Günter Guttroff, M. S. thesis, University of Texas at Austin, 1995.
  • 6
    • 3843149507 scopus 로고    scopus 로고
    • Similar interference pattern has been observed by D. W. Pohl and co-workers by using a different king of reflection/aperture geometry. D. W. Pohl, U. Ch. Fischer, and U. T. Dürig, in Scanning Microcopy Technologies and Applications, edited by E. Clayton Teague, Proc. SPIE (SPIE, Washington, DC, 1988), Vol. 897, pp. 84-90.
    • Similar interference pattern has been observed by D. W. Pohl and co-workers by using a different king of reflection/aperture geometry. D. W. Pohl, U. Ch. Fischer, and U. T. Dürig, in Scanning Microcopy Technologies and Applications, edited by E. Clayton Teague, Proc. SPIE (SPIE, Washington, DC, 1988), Vol. 897, pp. 84-90.
  • 7
    • 21544475114 scopus 로고    scopus 로고
    • In comparison, the operation range for tip-sample distance is more limited by using shear-force feedback mechanism.
    • In comparison, the operation range for tip-sample distance is more limited by using shear-force feedback mechanism.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.