Probe-sample interactions in reflection near-field scanning optical microscopy

Applied Optics

Volumn 34, Issue 22, 1995, Pages 4869-4876

  Cline, J A ^a   Isaacson, M ^a  

^a Department of Population Medicine and Diagnostic Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013609481     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.004869     Document Type: Article

References (14)

1. E. Betzig and J. K. Trautman, "Near field optics: microscopy, spectroscopy and surface modification beyond the diffraction limit," Science 257, 189-195 (1992).
2. J. A. Cline, H. Barshatzky, and M. Isaacson, "Scanned-tip reflection mode near-field scanning optical microscopy," Ultramicroscopy 38, 299-304 (1991).
3. R. Toledo-Crow, B. W. Smith, J. K. Rogers, and M. Vaez-Iravani, "Near-field optical microscopy characterization of IC metrology," in Integrated Circuit Metrology, Inspection, and Process Control VIII, M. H. Bennett, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 2196, 62-73 (1994).
4. P. Moyer, "Development, physics and application of near-field scanning optical microscopy," Ph. D. dissertation (North Carolina State University, Raleigh, N. C., 1993).
5. N. F. van Hulst, M. H. P. Moers, O. F. J. Noordman, T. Faulkner, F. B. Segerink, K. O. van der Werf, B. G. de Grooth, and B. Bolger, "Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope," in Scanning Probe Microscopies, S. Manne, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1639, 36-43 (1992).
6. J. A. Cline and M. Isaacson, "Comparison of different modes of reflection in near-field optical imaging," Ultramicroscopy 57 (213), 147-152 (1994).
7. R. Toledo-Crow, Y. Chen, and M. Vaez-Iravani, "An atomic force regulated near field scanning optical microscope," in Scanning Probe Microscopies, S. Manne, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1639, 44-53 (1992).
8. E. Betzig, P. L. Finn, and J. S. Weiner, "Combined shear force and near-field scanning optical microscopy," Appl. Phys. Lett. 60, 2484-2486 (1992).
9. C. M. Sparrow, "Spectroscopic revolving power," Astrophys. J. 44, 76-86 (1916).
10. A. Portis, Electromagnetic Fields, Sources, and Media (Wiley, New York, 1978), p. 497.
11. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, New York, 1980), p. 629.
12. J. Weaver, C. Krafke, D. Lynch, and E. Koch, Optical Properties of Metals Part II, (Fachinformations Zentrum, Germany, 1981).
13. J. D. Jackson, Classical Electrodynamics (Wiley, New York, 1975), p. 355.
14. E. Betzig, J. K. Trautman, J. S. Weiner, T. D. Harris, and R. Wolfe, "Polarization contrast in near-field scanning optical microscopy," Appl. Opt. 31, 4563-4568 (1992).