Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles and Some Recent Developments

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 897, Issue , 1988, Pages 84-90

  Fischer, U C ^b   Durig U T ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b Leica Camera AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; DIFFRACTION; GEOMETRICAL OPTICS; OPTICAL DATA STORAGE; SCANNING;

BASIC PRINCIPLES; DIFFRACTION LIMITS; IMMEDIATE ENVIRONMENT; OPTICAL IMAGE; SCATTERING EFFICIENCY; SUB-WAVELENGTH; SURFACE HOLES; TOPOGRAPHIC MODE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 3843149507     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.944518     Document Type: Conference Paper

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