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Volumn 88, Issue 9, 2000, Pages 5079-5086

Contrast enhancement in the detection of defects in transparent layered structures: The use of optothermal interference technique in solar cell investigation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0013424540     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1312849     Document Type: Article
Times cited : (10)

References (18)
  • 3
    • 0001617216 scopus 로고
    • Thermal Wave Characterization and Inspection of Semiconductor Materials and Devices
    • edited by A. Mandelis North-Holland, New York
    • A. Rosencwaig, Thermal Wave Characterization and Inspection of Semiconductor Materials and Devices, in Photoacoustic and Thermal Wave Phenomena in Semiconductors, edited by A. Mandelis (North-Holland, New York, 1987), pp. 97-135.
    • (1987) Photoacoustic and Thermal Wave Phenomena in Semiconductors , pp. 97-135
    • Rosencwaig, A.1
  • 9
    • 0013336615 scopus 로고    scopus 로고
    • Optical Detection of Photothermal Phenomena in Operating Electronic Devices: Temperature and Defects Imaging
    • edited by A. Mandelis and P. Hess SPIE, Bellingham, WA
    • A. M. Mansanares, Optical Detection of Photothermal Phenomena in Operating Electronic Devices: Temperature and Defects Imaging, in Progress in Photothermal and Photoacoustic Science and Technology Vol. 4 edited by A. Mandelis and P. Hess (SPIE, Bellingham, WA, 2000), pp. 75-110.
    • (2000) Progress in Photothermal and Photoacoustic Science and Technology , vol.4 , pp. 75-110
    • Mansanares, A.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.