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Journal of Applied Physics

Volumn 90, Issue 2, 2001, Pages 976-979

Influence of electrical stress voltage on cathode degradation of organic light-emitting devices

(3) Lin, Karen Ke a Chua, Soo Jin a Lim, Shuang Fang a

a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012642887 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1376669 Document Type: Article

Times cited : (39)

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