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Volumn 29, Issue 3, 2000, Pages 203-211

Development of total reflection x-ray fluorescence analysis at the Atominstitute of the Austrian Universities

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; SYNCHROTRONS; TRACE ELEMENTS; X RAY TUBES;

EID: 0012391811     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(200005/06)29:3<203::AID-XRS410>3.0.CO;2-P     Document Type: Article
Times cited : (7)

References (54)
  • 7
    • 85159256310 scopus 로고    scopus 로고
    • Rieh, Seifert & Co, Ahrensburg, Germany
    • Rieh, Seifert & Co, Ahrensburg, Germany.
  • 10
    • 85159245624 scopus 로고    scopus 로고
    • CSI, Prague, 1977 and CSI, Cambridge, 1979
    • CSI, Prague, 1977 and CSI, Cambridge, 1979.
  • 11
    • 85159253692 scopus 로고
    • Doctoral Thesis, TU Wien, Vienna
    • Lurf G. Doctoral Thesis, TU Wien, Vienna, 1984.
    • (1984)
    • Lurf, G.1
  • 15
    • 85159249016 scopus 로고
    • Doctoral Thesis, University of Hamburg
    • Prange A. Doctoral Thesis, University of Hamburg, 1983.
    • (1983)
    • Prange, A.1
  • 36
    • 85159251226 scopus 로고    scopus 로고
    • SEMATEC Roadmad. http://www.itrs.net/ntrs/publntrs.nsf
    • SEMATEC Roadmad
  • 42
    • 85159250719 scopus 로고    scopus 로고
    • to be published
    • Van Aarle J. to be published.
    • Van Aarle, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.