X-ray photoemission spectroscopy of thin films

Current Opinion in Solid State and Materials Science

Volumn 2, Issue 5, 1997, Pages 511-516

  Hartmann, Andreas J ^a   Lamb, Robert N ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

CVD chemical vapour deposition; EELS electron energy loss spectroscopy; EXAFS extended X ray absorption fine structure; FWHM full width at half maximum; LEED low energy electron diffraction; MBE molecular beam epitaxy; MOD metal organic deposition

Indexed keywords

EID: 0012065165     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(97)80038-1     Document Type: Article

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