Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

Applied Physics Letters

Volumn 76, Issue 17, 2000, Pages 2442-2444

  Angelis, C T ^a   Dimitriadis, C A ^a   Farmakis, F V ^b   Brini, J ^b   Kamarinos, G ^b   Miyasaka, M ^c  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b Grenoble INP Phelma   (France)

^c SEIKO EPSON CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011782098     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126370     Document Type: Article

References (9)

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