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Volumn 38, Issue 34, 1999, Pages 7112-7127

Vacuum temperature-dependent ellipsometric studies on WO3 thin films

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EID: 0011482562     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.007112     Document Type: Article
Times cited : (11)

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