Two-step temporal phase unwrapping in profilometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3098, Issue , 1997, Pages 271-282

  Surrel, Yves ^a  

^a ECOLE DES MINES DE SAINT ETIENNE   (France)

Author keywords

phase unwrapping; Profilometry; projected fringes; shape acquisition; spatial phase stepping

Indexed keywords

DYNAMIC RANGE; FRINGE PROJECTION; HIGH FREQUENCY; HIGH SENSITIVITY; LOW FREQUENCY; PHASE MAPS; PHASE UNWRAPPING; PROJECTED FRINGE; SHAPE ACQUISITION; SPATIAL PHASE-STEPPING; TEMPORAL PHASE UNWRAPPING;

OPTICAL TESTING; PROFILOMETRY;

SIGNAL NOISE MEASUREMENT;

EID: 0011350817     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.281170     Document Type: Conference Paper

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