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Volumn 88, Issue 12, 2000, Pages 7150-7156

Asymmetric peak line shape of infrared dielectric function spectra for thermally grown silicon dioxide films

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EID: 0011082423     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1325377     Document Type: Article
Times cited : (36)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.