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Volumn 88, Issue 12, 2000, Pages 7150-7156
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Asymmetric peak line shape of infrared dielectric function spectra for thermally grown silicon dioxide films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0011082423
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1325377 Document Type: Article |
Times cited : (36)
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References (26)
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