Wide-band low-noise tunnel current measurements in laser assisted experiments

Review of Scientific Instruments

Volumn 70, Issue 7, 1999, Pages 3173-3176

  Jersch, J ^a   Demming, F ^a   Fedotov, I ^a   Dickmann, K ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010249348     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149882     Document Type: Article

References (15)

1. C. J. Chen, Introduction to Scanning Tunneling Microscopy (Oxford University Press, New York, 1993).
2. G. De Geronimo, G. Bertuccio, and A. Longoni, Rev. Sci. Instrum. 67, 2643 (1996).
3. Y. P. Chen, A. J. Cox, M. J. Hagmann, and H. D. A. Smith, Rev. Sci. Instrum. 67, 2652 (1996).
4. B. Michel, L. Novotny, and U. Dürig, Ultramicroscopy 42-44, 1647 (1992).
5. A. Moreau and J. B. Ketterson, J. Appl. Phys. 72, 861 (1992).
6. U. Tietze and Ch. Schenk, Halbleiter-Schaltungstechnik, 10th ed. (Springer, Berlin, 1993).
7. Single Charge Tunneling - Coulomb Blockade Phenomena in Nanostructures, edited by H. Grabert and M. H. Devoret (Plenum, New York, 1992).
8. T. Kalthoff, T. Wang, and R. M. Stitt, Burr-Brown Applikation Bulletin AB-007A (1991).
9. J. Jersch, F. Demming, I. Fedotov, and K. Dickmann (unpublished).
10. I. Lyubinetsky, Z. Dohnalek, V. A. Ukraintsev, and J. T. Yates, Jr., J. Appl. Phys. 82, 4115 (1997).
11. J. Boneberg, M. Tresp, M. Ochmann, H.-J. Muenzer, and P. Leiderer, Appl. Phys. A: Mater. Sci. Process. 66, 615 (1997).
12. J. Jersch and K. Dickmann, Appl. Phys. Lett. 68, 868 (1996).
13. F. Demming, K. Dickmann, and J. Jersch, Rev. Sci. Instrum. 69, 2406 (1998).
14. D. Lichtman and J. F. Ready, Phys. Rev. Lett. 10, 342 (1963).
15. J. Jersch, F. Demming, I. Fedotov, and K. Dickmann, Appl. Phys. A: Mater. Sci. Process. 68, 6 (1999).