Contactless electroreflectance and piezoreflectance studies of temperature-dependent strain in ZnTe/GaAs heterostructures with ZnSe/ZnTe superlattice buffer layers

Applied Physics Letters

Volumn 72, Issue 24, 1998, Pages 3184-3186

  Tu, R C ^a   Su, Y K ^a   Chen, H J ^b   Huang, Y S ^b   Chou, S T ^c  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL DEFENSE UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010227432     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121587     Document Type: Article

References (18)

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