Local microstructures of Si in GaN studied by x-ray absorption spectroscopy

Applied Physics Letters

Volumn 75, Issue 4, 1999, Pages 534-536

  Lu, Z H ^a   Tyliszczak, T ^b   Broderson, P ^b   Hitchcock, A P ^b   Webb, J B ^c   Tang, H ^c   Bardwell, J ^c  

^a UNIVERSITY OF TORONTO   (Canada)

^b MCMASTER UNIVERSITY   (Canada)

^c NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010115606     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124439     Document Type: Article

References (16)

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