On the possible identification of defects using the autocorrelation function approach in double Doppler broadening of annihilation radiation spectroscopy

Journal of Physics Condensed Matter

Volumn 10, Issue 46, 1998, Pages 10475-10492

  Beling, C D ^a   LiMing, W ^a   Shan, Y Y ^a   Cheung, S H ^a   Fung, S ^a   Panda, B K ^b   Seitsonen, A P ^c  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009768081     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/10/46/015     Document Type: Article

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