SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 116, Issue , 1997, Pages 121-128

Positron deep level transient spectroscopy - A new application of positron annihilation to semiconductor physics

(7) Beling, C D a Fung, S a Au, H L a Ling, C C a Reddy, C V a Deng, A H a Panda, B K a

a UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; DEEP LEVEL TRANSIENT SPECTROSCOPY; DOPPLER EFFECT; ELECTRIC FIELD MEASUREMENT; ELECTRON ENERGY LEVELS; IONIZATION; PARTICLE BEAM DYNAMICS; PARTICLE BEAMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DOPING; TRANSIENTS;

POSITRON ANNIHILATION; POSITRON BEAMS; POSITRON LIFETIMES; POSITRON MOBILITY; SEMICONDUCTOR PHYSICS;

HETEROJUNCTIONS;

EID: 0031547814 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(96)01040-9 Document Type: Article

Times cited : (10)

References (15)

1
- 0001602949
- C. Corbel, F. Pierre, K. Saarinen, P. Hautojärvi, P. Moser, Phys. Rev. B 45 (1992) 3386.
- (1992) Phys. Rev. B , vol.45 , pp. 3386
- Corbel, C.¹ Pierre, F.² Saarinen, K.³ Hautojärvi, P.⁴ Moser, P.⁵

2
- 0039826566
- S. Dannefaer P. Mascher and D. Kerr, J. Phys.: Condens. Matter. 1 (1989) 3212.
- (1989) J. Phys.: Condens. Matter. , vol.1 , pp. 3212
- Dannefaer, S.¹ Mascher, P.² Kerr, D.³

3
- 0028259380
- Y. Itoh and H. Murakami, Appl. Phys. A 58 (1994) 59.
- (1994) Appl. Phys. A , vol.58 , pp. 59
- Itoh, Y.¹ Murakami, H.²

4
- 0000491906
- R. Krause-Rehberg, H.S. Leipner, A. Kupsch, A. Polity and Th. Drost, Phys. Rev. B 49 (1994) 2385.
- (1994) Phys. Rev. B , vol.49 , pp. 2385
- Krause-Rehberg, R.¹ Leipner, H.S.² Kupsch, A.³ Polity, A.⁴ Drost, Th.⁵

5
- 3743056389
- H.L. Au, C.C. Ling, B.K. Panda, T.C. Lee, C.D. Beling and S. Fung, Phys. Rev. Lett. 73 (1994) 2732.
- (1994) Phys. Rev. Lett. , vol.73 , pp. 2732
- Au, H.L.¹ Ling, C.C.² Panda, B.K.³ Lee, T.C.⁴ Beling, C.D.⁵ Fung, S.⁶

6
- 24244479983
- Y.Y. Shan, C.C. Ling, A.H. Deng, B.K. Panda, C.D. Beling and S. Fung, Phys. Rev. B (1997).
- (1997) Phys. Rev. B
- Shan, Y.Y.¹ Ling, C.C.² Deng, A.H.³ Panda, B.K.⁴ Beling, C.D.⁵ Fung, S.⁶

7
- 0003546026
- Clarendon, Oxford
- E.H. Rhoderick and R.H. Williams, Metal-Semiconductor Contacts, 2nd ed. (Clarendon, Oxford, 1988) p. 162.
- (1988) Metal-semiconductor Contacts, 2nd Ed. , pp. 162
- Rhoderick, E.H.¹ Williams, R.H.²

8
- 0004101812
- Springer Verlag, Berlin
- M. Lannoo and J. Bourgoin, Point Defects in Semiconductors II (Springer Verlag, Berlin, 1983) p. 157.
- (1983) Point Defects in Semiconductors , vol.2 , pp. 157
- Lannoo, M.¹ Bourgoin, J.²

9
- 0001139686
- A.P. Mills, Jr., E.M. Gulliksen, L. Pfeiffer and W.S. Rockward, Phys. Rev. B 33 (1986) 7799.
- (1986) Phys. Rev. B , vol.33 , pp. 7799
- Mills A.P., Jr.¹ Gulliksen, E.M.² Pfeiffer, L.³ Rockward, W.S.⁴

10
- 0028514043
- Y.Y. Shan, H.L. Au, C.C. Ling, T.C. Lee, B.K. Panda, S. Fung, C.D. Beling, Y.Y. Wang and H.M. Weng, Appl. Phys. A 59 (1994) 259.
- (1994) Appl. Phys. A , vol.59 , pp. 259
- Shan, Y.Y.¹ Au, H.L.² Ling, C.C.³ Lee, T.C.⁴ Panda, B.K.⁵ Fung, S.⁶ Beling, C.D.⁷ Wang, Y.Y.⁸ Weng, H.M.⁹

11
- 0000127152
- M. Kaminska, M. Skowronski and W. Kuszko, Phys. Rev. Lett. 55 (1985) 2204.
- (1985) Phys. Rev. Lett. , vol.55 , pp. 2204
- Kaminska, M.¹ Skowronski, M.² Kuszko, W.³

12
- 0022561204
- F.D. Auret, A.W.R. Leitch and J.S. Vermaak, J. Appl. Phys. 59 (1986) 158.
- (1986) J. Appl. Phys. , vol.59 , pp. 158
- Auret, F.D.¹ Leitch, A.W.R.² Vermaak, J.S.³

13
- 0016081645
- D.V. Lang, J. Appl. Phys. 45 (1974) 3014.
- (1974) J. Appl. Phys. , vol.45 , pp. 3014
- Lang, D.V.¹

14
- 12044254792
- M.J. Puska and R.M. Nieminen, Rev. Mod. Phys. 66 (1994) 841.
- (1994) Rev. Mod. Phys. , vol.66 , pp. 841
- Puska, M.J.¹ Nieminen, R.M.²

15
- 84990662028
- H.L. Au, P. Asoka-Kumar, C.D. Beling, S. Fung and K.G. Lynn, Phys. Status Solidi (b) 178 (1993) K11.
- (1993) Phys. Status Solidi (B) , vol.178
- Au, H.L.¹ Asoka-Kumar, P.² Beling, C.D.³ Fung, S.⁴ Lynn, K.G.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.