Diffraction pattern of a defect: Two-dimensional angular correlation of positron-annihilation radiation studies of defects in semiconductors

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 7, 1997, Pages 4046-4049

  McMullen, T ^a   Bishop, Marilyn F ^a  

^a VIRGINIA COMMONWEALTH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0242669436     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.4046     Document Type: Article

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