A step-down lenth method for analyzing unreplicated factorial designs

Journal of Quality Technology

Volumn 33, Issue 2, 2001, Pages 140-152

  Ye, Kenny Q ^a,d   Hamada, Michael ^b   Wu, C F J ^c,d  

^a STONY BROOK UNIVERSITY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d Dept of Appl Math and Statistics ^*

Author keywords

Experimentwise Error Rate; Individual Error Rate; Power

Indexed keywords

EID: 0009732898     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2001.11980063     Document Type: Article

References (13)

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