SCOPUS 정보 검색 플랫폼

Volumn 32, Issue 1, 2000, Pages 57-66

Critical values of the Lenth method for unreplicated factorial designs

a STONY BROOK UNIVERSITY (United States)

b LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

Confidence intervals; Experimentwise error rate; Factorial designs; Fractional factorial designs; Individual error rate; Mixed level designs; Plackett burman designs; Simulation

Indexed keywords

EID: 1642582109 PISSN: 00224065 EISSN: None Source Type: Journal
DOI: 10.1080/00224065.2000.11979971 Document Type: Article

Times cited : (56)

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6
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7
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.