Strain-induced diffusion in a strained Si1 - XGex/Si heterostructure

Applied Physics Letters

Volumn 77, Issue 25, 2000, Pages 4157-4159

  Lim, Y S ^a   Lee, J Y ^a   Kim, H S ^b   Moon, D W ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

^c Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009501762     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1327280     Document Type: Article

References (12)

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