Generation of optimum test stimuli for nonlinear analog circuits using nonlinear programming and time-domain sensitivities

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 603-608

  Burdiek, Bernhard ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION CRITERIA; FUNCTIONAL FLOW; HARD-TO-DETECT FAULTS; NONLINEAR ANALOG CIRCUITS; NONLINEAR PROGRAMMING PROBLEM; PARAMETER VECTORS; PROGRAMMING PROBLEM; TIME DOMAIN SENSITIVITY;

ANALOG CIRCUITS; EXHIBITIONS; FAULT DETECTION; FUNCTIONAL PROGRAMMING; NONLINEAR PROGRAMMING; OPTIMIZATION;

TESTING;

EID: 0009492802     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915085     Document Type: Conference Paper

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