Interferometric measurements of small-scale irregularities: Highly reflecting surfaces

Optical Engineering

Volumn 37, Issue 10, 1998, Pages 2751-2753

  Hariharan, Parameswaran ^a  

^a CSIRO   (Australia)

Author keywords

Highly reflecting surfaces; Interferometry; Optical testing; Small scale irregularities

Indexed keywords

EID: 0009289087     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601814     Document Type: Article

References (7)

1. P. Hariharan, "Optical flat surfaces: direct interferometric measurements of small-scale irregularities," Opt. Eng. 35(11), 3265-3266 (1996).
2. P. Hariharan, Optical Interferometry, p. 63, Academic Press. Sydney (1985).
3. P. Hariharan, "Digital phase-shifting interfcrometry: effects of multiply-reflected beams," Appl. Opt. 26(13), 2506-2507 (1987).
4. P. Hariharan and M. A. Suchting, "Optical flat surfaces: subtraction of small-scale irregularities of the reference surface," in Laser Interferometry VIII: Techniques and Analysis, M. Kujawinska, R. J. Pryputniewicz and M. Takeda, Eds., Proc. SPIE 2860, 306-312 (1996).
5. P. B. Clapham and G. D. Dew, "Surface-coated reference flats for testing fully aluminized surfaces by means of the Fizeau interferometer," J. Sci. Instrum. 44(11), 899-902 (1967).
6. D. Malacara, "Twyman-Green interferometer," Chap. 2 in Optical Shop Testing, D. Malacara, Ed., pp. 51-94, John Wiley, New York (1992).
7. P. Hariharan, "Interferometric measurements of small-scale surface irregularities: sources of errors." Opt. Eng. 36(8), 2330-2334 (1997).