Interferometric measurements of small-scale surface irregularities: Sources of errors

Optical Engineering

Volumn 36, Issue 8, 1997, Pages 2330-2334

  Hariharan, Parameswaran ^a  

^a CSIRO   (Australia)

Author keywords

Error sources; Interferometry; Optical testing; Small scale irregularities

Indexed keywords

EID: 0038011814     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601460     Document Type: Article

References (11)

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