Dependence of Al layer growth mode on Cr underlayer thickness in molecular-beam epitaxy of (001) Al/Cr superlattices

Journal of Applied Physics

Volumn 88, Issue 4, 2000, Pages 1838-1843

  Kingetsu, Toshiki ^a,c   Kamada, Yasuhiro ^b   Yamamoto, Masahiko ^b  

^a RIGAKU CORPORATION   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c Nisshin Steel Co Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008661991     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1305461     Document Type: Article

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