Characterization of wave fronts of light beams by use of tunneling cantilevers

Applied Optics

Volumn 40, Issue 5, 2001, Pages 678-682

  Dragoman, Daniela ^a,b   Dragoman, Mircea ^c  

^a UNIVERSITY OF BUCHAREST   (Romania)

^b Natl Inst Res/Devmt M ^*  (Romania)

^c NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; CHARACTERIZATION; ELASTIC MODULI;

TUNNELING CANTILEVERS;

LIGHT;

EID: 0008508535     PISSN: 00036935     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.40.000678     Document Type: Article

References (12)

1. R. W. Gerchberg and W. O. Saxton, "A practical algorithm for the determination of phase from image and diffraction plane pictures," Optik (Stuttgart) 35, 237-246 (1972).
2. T. E. Gureyev and K. A. Nugent, "Phase retrieval with the transport-of-intensity equation. II. Orthogonal series solution for nonuniform illumination," J. Opt. Soc. Am. A 13, 1670-1682 (1996).
3. N. Nakajima, "Phase retrieval from Fresnel zone intensity measurements by use of Gaussian filtering," Appl. Opt. 37, 6219-6226 (1998).
4. S. R. Dean, The Radon Transform and Some of Its Applications (Wiley, New York, 1993).
5. D. Dragoman and M. Dragoman, "Optical actuation of micromechanical tunneling structures with applications in spectrum analysis and optical computing," Appl. Opt. 38, 6773-6778 (1999).
6. M. A. McCord, A. Dana, and R. P. W. Pease, "The micromechanical tunneling transistor," J. Micromech. Microeng. 8, 209-212 (1998).
7. M. Born and E. Wolf, Principles of Optics, 4th ed. (Pergamon, Oxford, UK, 1970), Chap. 3.
8. +-GaAlAs-GaAs-Ag asymmetric Fabry-Perot device structure," Appl. Phys. Lett. 64, 898-900 (1994).
9. C. P. Klingshirn, Semiconductor Optics (Springer, Berlin, 1997), Chap. 3.
10. O. Marti, A. Ruf, M. Hipp, H. Bielefeldt, J. Colchero, and J. Mlynek, "Micromechanical and thermal effects on force micro-scope cantilevers," Ultramicroscopy 42-44, 345-349 (1992).
11. K. Y. Yasumura, T. D. Stowe, E. M. Chow, T. Pfafman, T. W. Kenny, B. C. Stipe, and D. Rugar, "Quality factors in micron-and submicron-thick cantilevers," IEEE J. Quantum Electron. 9, 117-125 (2000).
12. M. Grabherr, M. Miller, R. Jäger, R. Michalzik, U. Martin, H. J. Unold, and K. J. Ebeling, "High-power VCSEL's: single devices and densely packed 2D arrays," IEEE J. Sel. Top. Quantum Electron. 5, 495-502 (1999).