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Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6659-6661

Dependence of exchange coupling in permalloy/Cr82Al18 bilayers on the constituent layer thickness

(3) Zhou, S M a Liu, Kai a Chien, C L a

a JOHNS HOPKINS UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008489634 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.372802 Document Type: Article

Times cited : (22)

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