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Volumn 74, Issue 7, 1999, Pages 988-990

Determination of EL2 capture and emission coefficients in semi-insulating n-GaAs

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0008158793     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123432     Document Type: Article
Times cited : (13)

References (17)
  • 9
    • 0004725926 scopus 로고
    • Defect Recognition and Image Processing in Semiconductors and Devices, Proceedings of the Fifth International Conference, edited by J. Jimenez. Inst. Phys. Conf. Series 135 (IOP, Bristol, 1993)
    • K. Berwick, M. R. Brozel, C. M. Buttar, M. Cowperthwaite, and Y. Hou, in Defect Recognition and Image Processing in Semiconductors and Devices, Proceedings of the Fifth International Conference, edited by J. Jimenez. Inst. Phys. Conf. Series 135 (IOP, Bristol, 1993) [ Inst. Phys. Conf. Ser. 135, 305 (1993)].
    • (1993) Inst. Phys. Conf. Ser. , vol.135 , pp. 305
    • Berwick, K.1    Brozel, M.R.2    Buttar, C.M.3    Cowperthwaite, M.4    Hou, Y.5
  • 16
    • 5344219670 scopus 로고
    • edited by P. T. Landsberg Elsevier, Amsterdam
    • E. Schöll, in Handbook on Semiconductors, 2nd ed., edited by P. T. Landsberg (Elsevier, Amsterdam, 1992), Vol. 1, pp. 419-447.
    • (1992) Handbook on Semiconductors, 2nd Ed. , vol.1 , pp. 419-447
    • Schöll, E.1
  • 17
    • 0012537883 scopus 로고
    • Nonlinear Dynamics and Pattern Formation Semiconductors and Devices, edited by F.-J. Niedernostheide Springer, Berlin
    • V. A. Samuilov, in Nonlinear Dynamics and Pattern Formation Semiconductors and Devices, Springer Proceedings in Physics, Vol. 79, edited by F.-J. Niedernostheide (Springer, Berlin, 1995), p. 220.
    • (1995) Springer Proceedings in Physics , vol.79 , pp. 220
    • Samuilov, V.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.