메뉴 건너뛰기




Volumn 16, Issue 6, 1998, Pages 3086-3096

Self-heating effects in a InP/CdS/LaS cold cathode

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0007914475     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590446     Document Type: Article
Times cited : (6)

References (36)
  • 12
    • 0001237842 scopus 로고
    • W. P. Shen and H. S. Kwok, Appl. Phys. Lett. 65, 2162 (1994). In this letter the authors report the epitaxial growth of various II-VI compound semiconductors (ZnS, ZnSe, CdS, CdSe, and CdTe) on (111) and (100) InP and GaAs substrates by excimer laser ablation. All the films have good crystalline quality (fully in-plane) and mirror-like surface morphology. They found that, on (111)-oriented substrates, CdS and CdSe films were in the hexagonal phase with the c axis perpendicular to the surface, while ZnS and ZnSe films were in the cubic phase. The films grown on (100)-oriented substrates were all cubic; see also W. P. Shen and H. S. Kwok, Mater. Res. Soc. Symp. Proc. 340, 457 (1994).
    • (1994) Appl. Phys. Lett. , vol.65 , pp. 2162
    • Shen, W.P.1    Kwok, H.S.2
  • 13
    • 0028573266 scopus 로고
    • W. P. Shen and H. S. Kwok, Appl. Phys. Lett. 65, 2162 (1994). In this letter the authors report the epitaxial growth of various II-VI compound semiconductors (ZnS, ZnSe, CdS, CdSe, and CdTe) on (111) and (100) InP and GaAs substrates by excimer laser ablation. All the films have good crystalline quality (fully in-plane) and mirror-like surface morphology. They found that, on (111)-oriented substrates, CdS and CdSe films were in the hexagonal phase with the c axis perpendicular to the surface, while ZnS and ZnSe films were in the cubic phase. The films grown on (100)-oriented substrates were all cubic; see also W. P. Shen and H. S. Kwok, Mater. Res. Soc. Symp. Proc. 340, 457 (1994).
    • (1994) Mater. Res. Soc. Symp. Proc. , vol.340 , pp. 457
    • Shen, W.P.1    Kwok, H.S.2
  • 14
    • 0003612533 scopus 로고
    • Plenum, New York
    • The room temperature work function for LaS was calculated by extrapolating measured work function values at high temperature as reported by S. Fomenko, Handbook of Thermionic Properties (Plenum, New York, 1966). Within the range of temperature investigated by Fomenko, the LaS work function increases with temperature at a rate of 2 meV/K.
    • (1966) Handbook of Thermionic Properties
    • Fomenko, S.1
  • 17
    • 11744345444 scopus 로고    scopus 로고
    • note
    • THe driving force behind our simple analytical model is to obtain analytical expressions to describe the essential physics of the cold cathode operation. A more complete model would require sophisticated simulations tools, such as Monte Carlo description of carrier transport through the entire structure. This approach is far too complicated for the design of prototype cathodes.
  • 19
    • 0003554309 scopus 로고
    • Springer, New York
    • There are conflicting reports for the measured electron affinity of CdS. The affinity is known to vary with the surface orientation and the phase of the semiconductor material. Here, we use the electron affinity 4.2 eV reported in, O. Madelung, Semiconductors other than Group IV Elements and III-V Compounds (Springer, New York, 1992).
    • (1992) Semiconductors Other Than Group IV Elements and III-V Compounds
    • Madelung, O.1
  • 20
    • 0003832103 scopus 로고
    • Prentice Hall Series in Electrical and Computer Engineering, L. O. Chua, Series Editor Prentice Hall, Englewood Cliffs, NJ
    • S. Wang, Fundamental of Semiconductor Theory and Device Physics, Prentice Hall Series in Electrical and Computer Engineering, L. O. Chua, Series Editor (Prentice Hall, Englewood Cliffs, NJ, 1989).
    • (1989) Fundamental of Semiconductor Theory and Device Physics
    • Wang, S.1
  • 21
    • 85088546152 scopus 로고    scopus 로고
    • note
    • c was assumed to be given by Anderson's rule, i.e., Δ in Fig. 2 is assumed to be given by |χ(InP)-χ(CdS)|=0.2 eV. This estimate was based on the measured electron affinities of CdS (4.2 eV) and InP (4.4 eV).
  • 26
    • 0001334714 scopus 로고    scopus 로고
    • Similar parametric representation of the FN emission current has been used recently by Koehler and Hummelgen [Appl. Phys. Lett. 70, 3254 (1997)] to model the temperature dependence of the tunneling current through a triangular barrier at metal/polymer interface. These interfaces are also characterized by a small barrier height.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 3254
    • Koehler1    Hummelgen2
  • 27
    • 11744376255 scopus 로고    scopus 로고
    • Dissipation Processes in Veiled Work Function Emitters
    • Task ELM-2, Wright-Patterson Air Force Base May
    • W. Friz, "Dissipation Processes in Veiled Work Function Emitters," Final Technical Report, Task ELM-2, Wright-Patterson Air Force Base (May 1996).
    • (1996) Final Technical Report
    • Friz, W.1
  • 28
    • 0003679914 scopus 로고
    • Cambridge University Press, Cambridge
    • J. M. Ziman, Theory of Solids (Cambridge University Press, Cambridge, 1972).
    • (1972) Theory of Solids
    • Ziman, J.M.1
  • 30
    • 85088545697 scopus 로고    scopus 로고
    • 1 was used in the numerical examples of Ref. 9
    • 1 was used in the numerical examples of Ref. 9.
  • 32
    • 11744381726 scopus 로고    scopus 로고
    • The fraction of the current lost to inelastic collisions is assumed to be reaccelerated by the electric field in the CdS layer and to rejoin the constant total current as a lower energy component
    • The fraction of the current lost to inelastic collisions is assumed to be reaccelerated by the electric field in the CdS layer and to rejoin the constant total current as a lower energy component.
  • 35
    • 85088546114 scopus 로고    scopus 로고
    • -1 by Raman spectroscopy (P. Boolchand, private communication)
    • -1 by Raman spectroscopy (P. Boolchand, private communication).
  • 36
    • 85088546897 scopus 로고    scopus 로고
    • 0 for the operating range of biases investigated in all numerical simulations
    • 0 for the operating range of biases investigated in all numerical simulations.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.