Atomic force microscopy, Part 7: Studies of thermal phase transitions in polymers

American Laboratory

Volumn 30, Issue 22, 1998, Pages 15-21

  Magonov, Sergei ^a,b   Godovsky, Yali ^a,b  

^a Digital Instruments   (United States)

^b KARPOV INSTITUTE OF PHYSICAL CHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007137774     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review

References (11)

1. Magonov SN, Reneker D. Ann Rev Mat Sci 1997; 27:175.
2. Magonov S, Heaton M. Am Lab May 1998; 30(10):9.
3. Magonov SN, Elings V, Papkov VS. Polymer 1997; 38:297.
4. Pearce R, Vansco J. Polymer 1998; 39:1237.
5. Sikes HD, Schwartz DK. Science 1997; 278:1604.
6. Wendman M, Tench R, Bocek D, Kjoller K. Scanning thermal microscopy with NanoScope® scanning probe microscopes. Application note. Santa Barbara, CA: Digital Instruments Inc., 1998.
7. Godovsky Y, Magonov S. In preparation.
8. Molenberg A, Moeller M, Sautter E. Progr Polym Sci 1997; 22:1053.
9. Godovsky YK, Papkov VS. Adv Polym Sci 1989; 129:129.
10. Makarova NN, Godovsky YK. Progr Polym Sci 1997; 22:1001.
11. Godovsky YK, Slonimsky GL, Grabar NM. J Polym Sci Part C 1972; 38:1.