Surface roughness and grain boundary scattering effects on the electrical conductivity of thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 15, 1998, Pages 9685-9688

  Palasantzas, George ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006830632     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.9685     Document Type: Article

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