Optical gate action of a molecular thin film probed with femtosecond near-field optical microscopy

Applied Physics Letters

Volumn 77, Issue 9, 2000, Pages 1283-1285

  Kawashima, H ^a   Furuki, M ^b,c   Tatsuura, S ^b   Tian, M ^c   Sato, Y ^c   Pu, L S ^c   Tani, T ^d  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b WASEDA UNIVERSITY   (Japan)

^c FUJI XEROX CO LTD   (Japan)

^d TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006523562     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1289902     Document Type: Article

References (18)

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17. The peak of the nonlinear transmittance is a factor of 40 greater in the local measurement than in the global one. This is because nearly equal pumping power was focused more tightly with the objective lens in the local measurement than in the global one.
18. The SHG intensity autocorrelation trace of the pump pulse was 10% shorter than the corresponding trace of the probe pulse because of less dispersion along the optical path. The idealistic gate action replicates the SHG cross correlation between the two pulses, and is supposed to be a few percent shorter than the SHG trace in Fig. 4.