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Volumn 80, Issue 1-4, 1998, Pages 363-367

EXAFS analysis of Er sites in Er-O and Er-F co-doped crystalline Si

Author keywords

Erbium; EXAFS; Ion implantation; Optoelectronic; Photoluminescence; Silicon

Indexed keywords


EID: 0006323902     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2313(98)00130-6     Document Type: Article
Times cited : (13)

References (15)
  • 11
    • 0001197071 scopus 로고
    • International Workshop on Standards and Criteria in X-ray Absorption Spectroscopy, Physica B 158 (1989) 701.
    • (1989) Physica B , vol.158 , pp. 701
  • 13
    • 0003681516 scopus 로고
    • Geneva
    • CERN Program Library Long Writeup D506, MINUIT reference manual, Geneva, 1992.
    • (1992) MINUIT Reference Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.