Strain Determination in Epitaxic Films of Materials of Orthorhombic Symmetry by High-Resolution X-ray Diffraction

Journal of Applied Crystallography

Volumn 31, Issue 6, 1998, Pages 831-834

  De Caro, L ^a   Tapfer, L ^a  

^a Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006307399     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889897019602     Document Type: Article

References (6)

1. De Caro, L., Giannini, C. & Tapfer, L. (1996). J. Appl. Phys. 79, 4101-4110 (and references therein).
2. Giannini, C., De Caro, L. & Tapfer, L. (1994). Solid State Commun. 91, 635-638.
3. Gusso, M., De Caro, L. & Tapfer, L. (1997). Thin Solid Films, 302, 239-249.
4. Haisma, J., Pistorius, J. A. & Mateika, D. (1990). J. Cryst. Growth, 102, 979-993.
5. Kamigaki, K., Terauchi, H., Terashima, T., Bando, Y. Iijima, K., Yamamoto, K., Hirata, K., Hayashi, K., Nakagawa, I. & Tomii, Y. (1991). J. Appl. Phys. 69, 3653-3662.
6. Servidori, M., Cembali, F., Fabbri, R. & Zani, A. (1992). J. Appl. Cryst. 25, 46-51.