Fast calibration of photodiodes in the near-infrared, visible and ultraviolet using a Fourier-transform spectrometer

Metrologia

Volumn 35, Issue 4, 1998, Pages 403-406

  Werner, L ^a   Fischer, J ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005976896     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/31     Document Type: Article

References (8)

1. Lei Fu, Fischer J., Metrologia, 1993, 30, 297-303.
2. Köhler R., Goebel R., Pello R., Metrologia, 1996, 33, 549-554.
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4. Nettleton D. H., Prior T. R., Ward T. H., Metrologia, 1993, 30, 425-432.
5. Thorne A. P., Advances in Standards and Methodology in Spectrophotometry (Edited by C. Burgess and K. D. Mielenz), Amsterdam, Elsevier Science, 1987, 367-374.
6. Werner L., Metrologia, 1995/96, 32, 531-534.
7. Butler D. J., Köhler R., Forbes G. W., Appl. Opt., 1996, 35, 2162-2166.
8. Werner L., UV stability of silicon photodiodes, Metrologia, 1998, 35, 407-411.