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Volumn 59, Issue 2-3, 2000, Pages 785-791
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Effect of the hydrogen partial pressure ratio on the properties of uc-Si : H films prepared by rf magnetron sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0005855312
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/s0042-207x(00)00348-1 Document Type: Article |
Times cited : (22)
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References (10)
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