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Volumn 59, Issue 2-3, 2000, Pages 785-791

Effect of the hydrogen partial pressure ratio on the properties of uc-Si : H films prepared by rf magnetron sputtering

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Indexed keywords


EID: 0005855312     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(00)00348-1     Document Type: Article
Times cited : (22)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.