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Volumn 298, Issue 1-2, 1997, Pages 200-210

A simple modification of the magnetron sputtering method for the deposition of boron-doped hydrogenated microcrystalline silicon films with enhanced doping efficiency

Author keywords

Amorphous materials; Silicon; Sputtering; Structural properties

Indexed keywords

BORON; CHEMICAL MODIFICATION; CONDUCTIVE FILMS; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; DOPING (ADDITIVES); FILM PREPARATION; HYDROGENATION; MAGNETRON SPUTTERING; MAGNETS; SILICON; SPUTTER DEPOSITION;

EID: 0031125093     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09325-X     Document Type: Article
Times cited : (2)

References (28)
  • 16
    • 0346325067 scopus 로고
    • Thesis of Universite De Neuchatel, Institut De Microtechnique, Switzerland
    • K. Prasad, Thesis of Universite De Neuchatel, Institut De Microtechnique, Switzerland, 1991.
    • (1991)
    • Prasad, K.1
  • 28
    • 0348215760 scopus 로고
    • Materials issues in microcrystalline semiconductors
    • Materials Research Society, Pittsburgh, PA
    • G. Yang, P. Bai, Y.J. Uu, B.Y. Tong, S.K. Wong, J. Du and I. Hill, Materials issues in microcrystalline semiconductors, Materials Research Society, Pittsburgh, PA, Mater. Res. Soc. Symp. Proc., 164 (1990) 321.
    • (1990) Mater. Res. Soc. Symp. Proc. , vol.164 , pp. 321
    • Yang, G.1    Bai, P.2    Uu, Y.J.3    Tong, B.Y.4    Wong, S.K.5    Du, J.6    Hill, I.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.